The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 25, 2018

Filed:

Dec. 20, 2016
Applicant:

General Electric Company, Schenectady, NY (US);

Inventors:

Robert William Bergman, Scotia, NY (US);

Thomas James Batzinger, Burnt Hills, NY (US);

Thomas Earnest Moldenhauer, Burnt Hills, NY (US);

Assignee:

GENERAL ELECTRIC COMPANY, Schenectady, NY (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01N 29/26 (2006.01); G01N 27/90 (2006.01); G01N 29/30 (2006.01); G01N 29/265 (2006.01); G01N 29/22 (2006.01);
U.S. Cl.
CPC ...
G01N 29/226 (2013.01); G01N 27/902 (2013.01); G01N 27/904 (2013.01); G01N 27/9086 (2013.01); G01N 29/262 (2013.01); G01N 29/265 (2013.01); G01N 29/30 (2013.01); G01N 27/9053 (2013.01); G01N 2291/0234 (2013.01); G01N 2291/0289 (2013.01); G01N 2291/106 (2013.01); G01N 2291/2636 (2013.01);
Abstract

Various aspects include methods of inspecting a substantially round hole in a material. One method can include: feeding a probe axially into the substantially round hole until the probe completely passes through the substantially round hole while the probe is activated; rotating the probe at least ninety degrees around a primary axis of the substantially round hole after feeding the probe completely through the substantially round hole; removing the probe axially from the substantially round hole after rotating the probe at least ninety degrees while the probe is activated; and compiling at least one of eddy current data or ultrasound data about the hole from the feeding of the probe axially into the substantially round hole and the removing of the probe axially from the substantially round hole.


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