The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 25, 2018
Filed:
Apr. 08, 2016
Applicant:
The Regents of the University of California, Oakland, CA (US);
Inventors:
Naomi Ginsberg, Oakland, CA (US);
Connor Gregory Bischak, Berkeley, CA (US);
Craig L. Hetherington, Berkeley, CA (US);
David M. Kaz, Oakland, CA (US);
Assignee:
The Regents of the University of California, Oakland, CA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 23/22 (2018.01); G01N 23/2254 (2018.01);
U.S. Cl.
CPC ...
G01N 23/2254 (2013.01); G01N 23/22 (2013.01); G01N 2223/612 (2013.01);
Abstract
Provided herein are non-invasive methods of nanoscale imaging of a sample using an illumination layer and an electron beam. For example, the electron may activate the illumination layer without activating the sample, and the illumination layer may emit cathodoluminescence to produce a nanoscale image of the sample.