The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 25, 2018

Filed:

Jun. 22, 2015
Applicant:

Flatfrog Laboratories Ab, Lund, SE;

Inventors:

Nicklas Ohlsson, Bunkeflostrand, SE;

Tomas Christiansson, Torna-hällestad, SE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/958 (2006.01); G06F 3/041 (2006.01); G06F 3/042 (2006.01); G01N 21/59 (2006.01); G01N 21/94 (2006.01);
U.S. Cl.
CPC ...
G01N 21/958 (2013.01); G01N 21/59 (2013.01); G01N 21/94 (2013.01); G06F 3/0418 (2013.01); G06F 3/0421 (2013.01); G01N 2021/945 (2013.01); G01N 2201/124 (2013.01); G06F 2203/04109 (2013.01);
Abstract

A device implements a method for detecting contamination of an FTIR-based panel. The apparatus generates projection signals representing detection lines that have propagated on a plurality of propagation paths by total internal reflection (TIR) inside a transmissive panel such that contamination on the panel surface causes attenuation (frustration) of at least one of the projection signals. The device generates a transmission value for each detection line in the transmissive panel, and determines the presence of contamination on the surface of the panel by comparing the transmission values according to at least one of the presented comparison techniques.


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