The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 25, 2018
Filed:
Jul. 28, 2017
Applicant:
Eric Hegstrom, Tucson, AZ (US);
Inventor:
Eric Hegstrom, Tucson, AZ (US);
Assignee:
LiteSentry Corporation, Northfield, MN (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 7/06 (2006.01); G01N 21/896 (2006.01); G01B 11/30 (2006.01); G01N 21/958 (2006.01);
U.S. Cl.
CPC ...
G01N 21/896 (2013.01); G01B 7/06 (2013.01); G01B 11/306 (2013.01); G01N 21/958 (2013.01);
Abstract
This present invention relates to an apparatus and method for measuring the profile and reflective optical power of one or more surfaces of transparent sheets and transmissive optical power and thickness of one or more transparent sheets at a plurality of locations over the complete transparent sheet. The measurement results are presented to a user graphically and all data is stored for further processing, process control, and quality assurance.
Quick Actions:
Hegstrom, Eric. (2018). Measurement of thickness, surface profile, and optical power of a transparent sheet (U.S. Patent No. 10161879). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10161879
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile