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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 10161863 B1

PDFFull Text
Date of Patent:
Dec. 25, 2018

Filed:

Dec. 18, 2015

Measurement of porous film

Applicant:

Ndc Technologies Limited, Essex, GB;

Inventors:

Kevin Paul Humphrey, Essex, GB;

Robert Peter Hammond, Essex, GB;

Assignee:

NDC Technologies Limited, Essex, GB;

Attorney:

Finnegan, Henderson, Farabow, Garrett & Dunner LLP

Primary Examiner:

Mark R Gaworecki

Int. Cl.
CPC ...
G01N 21/47 (2006.01); G01N 21/35 (2014.01); G01N 21/84 (2006.01); G01N 9/24 (2006.01); G01N 15/08 (2006.01); G01B 11/06 (2006.01); G01N 21/3563 (2014.01); G01N 21/86 (2006.01); G01N 21/3559 (2014.01); G01N 21/359 (2014.01);
U.S. Cl.
CPC ...
G01N 21/47 (2013.01); G01B 11/06 (2013.01); G01N 9/24 (2013.01); G01N 15/088 (2013.01); G01N 21/359 (2013.01); G01N 21/3559 (2013.01); G01N 21/3563 (2013.01); G01N 21/8422 (2013.01); G01N 21/86 (2013.01); G01N 2015/086 (2013.01); G01N 2015/0846 (2013.01);
Abstract

A method of calculating a first parameter of a first sample of a material is provided. The method includes determining a first and second wavelengths at which the material exhibits substantially no absorption; measuring a transmission of the first sample at the first wavelength; measuring a transmission of the first sample at the second wavelength; and calculating the first parameter of the first sample using a first multivariate regression model including first regression coefficients. The first parameter is a parameter which affects a total amount of radiation scattered by the first sample at the first and second wavelengths.

Find Patent Forward Citations

Humphrey, Kevin. (2018). Measurement of porous film (U.S. Patent No. 10161863). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10161863

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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