The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 25, 2018
Filed:
Nov. 24, 2015
Applicant:
Oerlikon Surface Solutions Ag, Pfaffikon, Pfaffikon SZ, CH;
Inventor:
Othmar Zueger, Triesen, LI;
Assignee:
OERLIKON SURFACE SOLUTIONS AG, PFÄFFIKON, Pfäffikon SZ, CH;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/33 (2006.01); G01N 21/84 (2006.01);
U.S. Cl.
CPC ...
G01N 21/33 (2013.01); G01N 21/8422 (2013.01); G01N 2021/845 (2013.01); G01N 2021/8411 (2013.01); G01N 2021/8427 (2013.01); G01N 2201/0636 (2013.01);
Abstract
An in-situ process-monitoring device for measuring a curing state of components coated with a UV-curable lacquer. The device includes at least one radiation source for curing the lacquer, as well as at least one signal source and at least one spectrometer for measuring radiation of the signal source reflected from the components, in order to determine the curing state. The measuring is carried out in a contactless manner, and the at least one signal source for the measuring is identical to the at least one radiation source for the curing.