The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 25, 2018
Filed:
Nov. 20, 2015
Applicant:
Becton, Dickinson and Company, Franklin Lakes, NJ (US);
Inventors:
Matthew J. Crow, Shoreline, WA (US);
Valdis J. Riekstins, Woodinville, WA (US);
Timothy Wayne Petersen, Seattle, WA (US);
Assignee:
BECTON, DICKINSON AND COMPANY, Franklin Lakes, NJ (US);
Primary Examiner:
Int. Cl.
CPC ...
G01N 15/14 (2006.01); G01N 15/10 (2006.01);
U.S. Cl.
CPC ...
G01N 15/1434 (2013.01); G01N 15/147 (2013.01); G01N 15/1459 (2013.01); G01N 2015/1006 (2013.01); G01N 2015/149 (2013.01); G01N 2015/1452 (2013.01);
Abstract
Aspects of the present disclosure include methods and systems for assessing alignment of a light source with a flow stream. Methods according to certain embodiments include detecting first and second light signals along a vertical axis of the a light irradiated flow stream and calculating a differential signal amplitude between the first light signal and second light signal to assess the alignment of the light source with the flow stream. Systems for practicing the subject methods are also described.