The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 25, 2018
Filed:
Apr. 15, 2016
Rodenstock Gmbh, München, DE;
RODENSTOCK GMBH, München, DE;
Abstract
In a method for calibrating a polarization axis measuring device, both flat sides of a calibration element in a polarization axis measuring device are irradiated with polarized light, wherein the method involves aligning in each case at least one polarization direction of the light in a first and/or second rotational position with a principal axis in a predefined angular relationship with respect to a polarization axis of the calibration element. Determining the rotational position of an axis of the calibration element is carried out by determining an angle bisector between the first and second rotational positions of the polarization direction of the incident light. The method involves assigning a predefined angle value for the rotational position of the principal axis of the polarization direction for which the latter is in the predefined angular relationship with respect to the axis of the calibration element inserted as intended. Furthermore, the invention relates to a method for determining polarization axes of spectacle lenses, to a calibration element, and to a polarization axis measuring device comprising a calibration element.