The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 25, 2018

Filed:

Mar. 12, 2015
Applicant:

Mayekawa Mfg. Co., Ltd., Tokyo, JP;

Inventors:

Shinji Kono, Tokyo, JP;

Kazuhiro Hattori, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01K 11/00 (2006.01); G01N 33/02 (2006.01); G01K 7/42 (2006.01);
U.S. Cl.
CPC ...
G01K 11/006 (2013.01); G01K 7/42 (2013.01); G01K 11/00 (2013.01); G01N 33/02 (2013.01);
Abstract

A method for measuring an internal temperature of a freezing target object includes: a placing step of placing the freezing target object in a microwave resonating magnetic field generated by a microwave resonator; a state detection step of detecting a resonant state of the freezing target object in a frozen state by using the microwave resonator and detecting an internal temperature of the freezing target object by using a temperature meter; a calibration curve calculation step of calculating a calibration curve by performing a regression analysis by using the resonant state as an explanatory variable and by using the internal temperature of the freezing target object as a response variable; and a temperature calculation step of calculating the internal temperature of the freezing target object in the frozen state by applying the resonant state detected in the detection step to the calibration curve calculated in the calibration curve calculation step.


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