The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 25, 2018

Filed:

Jun. 09, 2016
Applicant:

Ciena Corporation, Hanover, MD (US);

Inventors:

Yinqing Pei, Kanata, CA;

Jean-Luc Archambault, Ottawa, CA;

David W. Boertjes, Nepean, CA;

David R. Doucet, Almonte, CA;

Assignee:

Ciena Corporation, Hanover, MD (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01J 4/00 (2006.01); H01S 3/00 (2006.01); G02B 6/42 (2006.01);
U.S. Cl.
CPC ...
G01J 4/00 (2013.01); G02B 6/4216 (2013.01); H01S 3/0007 (2013.01);
Abstract

A polarimeter system integrated into an optical line system includes a transmitter coupled to a transmit filter communicatively coupled to an output port in an optical line device, wherein the transmitter is configured to generate a polarization probe signal, and wherein a wavelength of the polarization probe signal is configured to operate in-service with traffic-bearing channels on the output port; and a polarimeter receiver coupled to a receive filter communicatively coupled to an input port in the optical line device, wherein the polarimeter receiver is configured to vary arrangement of input light from the filter and to measure various outputs of the varied arrangement to derive measurement of State of Polarization (SOP) of the input light.


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