The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 25, 2018
Filed:
Jul. 28, 2015
Applicant:
Luna Innovations Incorporated, Roanoke, VA (US);
Inventors:
Janet Renee Pedrazzani, Newton, NJ (US);
Matthew Davis, Roanoke, VA (US);
Evan M. Lally, Blacksburg, VA (US);
Assignee:
LUNA INNOVATIONS INCORPORATED, Roanoke, VA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 9/02 (2006.01); G01D 5/353 (2006.01); G01L 1/24 (2006.01);
U.S. Cl.
CPC ...
G01D 5/35306 (2013.01); G01L 1/242 (2013.01);
Abstract
A high-speed interrogation system is provided for interferometric sensors, one example of which is an EFPI sensor, that operates based on spectral interference. The system uses a two mode operation that includes a lower speed, accurate absolute measurement mode and a higher speed, relative measurement mode. The system achieves greater overall measurement accuracy and speed than known sensor interrogation approaches.