The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 25, 2018
Filed:
Sep. 16, 2016
Applicant:
Micromass Uk Limited, Wilmslow, GB;
Inventors:
Mark Towers, Stockport, GB;
Paul Murray, Manchester, GB;
Assignee:
MICROMASS UK LIMITED, Wilmslow, GB;
Primary Examiner:
Int. Cl.
CPC ...
G01C 15/00 (2006.01); H01J 49/00 (2006.01); H01J 49/02 (2006.01); H01J 49/14 (2006.01); H01J 49/16 (2006.01); H01J 49/04 (2006.01);
U.S. Cl.
CPC ...
G01C 15/004 (2013.01); H01J 49/0031 (2013.01); H01J 49/025 (2013.01); H01J 49/0409 (2013.01); H01J 49/145 (2013.01); H01J 49/165 (2013.01); H01J 49/0404 (2013.01);
Abstract
An ion analysis instrument is disclosed comprising an indicator device for providing an indication of a relative positioning of an ion source, a sample, and/or a sampling orifice or capillary of an ion analysis instrument such as a mass or ion mobility spectrometer in order to facilitate re-alignment of one or more of these components following a change. The indicator device comprises a source of electromagnetic radiation such as a pair of lasers or image projection devices.