The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 25, 2018

Filed:

May. 29, 2015
Applicant:

Bentley Systems, Incorporated, Exton, PA (US);

Inventors:

Zheng Yi Wu, Watertown, CT (US);

Ehsan Roshani, Guelph, CA;

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01B 21/16 (2006.01); G01N 33/18 (2006.01); G06Q 10/04 (2012.01); G06Q 50/06 (2012.01); G06F 17/50 (2006.01); F17D 5/02 (2006.01);
U.S. Cl.
CPC ...
G01B 21/16 (2013.01); G01N 33/18 (2013.01); F17D 5/02 (2013.01); G06F 17/5009 (2013.01); G06Q 10/04 (2013.01); G06Q 50/06 (2013.01);
Abstract

In one example embodiment, an analysis application is used to optimize water quality sensor placement in a water distribution network by implementing a two-part optimization solution procedure, involving building an impact database, and determining an optimized water quality sensor location set using the impact database. The optimized sensor location set may indicate locations that maximize a length of pipes where water quality variations are detectable by at least one water quality sensor. Pipe wall reaction coefficients may be used as calibration parameters, with water quality indicated to be detectable at a possible sensor location when a change in its pipe wall reaction coefficients leads to a change in water quality at the possible sensor location that is greater than a threshold.


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