The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 25, 2018
Filed:
Jul. 15, 2016
Nec Laboratories America, Inc., Princeton, NJ (US);
Kai Zhang, Monmouth Junction, NJ (US);
Haifeng Chen, West Windsor, NJ (US);
Kenji Yoshihira, Princeton Junction, NJ (US);
Guofei Jiang, Princeton, NY (US);
NEC Corporation, , JP;
Abstract
Systems and methods are provided for optimizing system output in production systems, comprising. The method includes separating, by a processor, one or more initial input variables into a plurality of output variables, the output variables including environmental variables and system response variables. The method also includes building, using the processor, a nonparametric estimation that determines a relationship between one or more initial control variables and the system response variables, and estimating a global input-output mapping function, using the determined relationship, and a range of the environmental variables. The method further includes generating one or more optimal control variables from the initial control variables by maximizing the input-output mapping function and the range of the environmental variables. The method additionally includes incorporating one or more of the optimal control variables into a production system to increase production output of the production system.