The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 25, 2018

Filed:

Apr. 19, 2017
Applicants:

Philipp Bernhardt, Forchheim, DE;

Dirk Ertel, Forchheim, DE;

Inventors:

Philipp Bernhardt, Forchheim, DE;

Dirk Ertel, Forchheim, DE;

Assignee:

Siemens Healthcare GmbH, Erlangen, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); A61B 6/00 (2006.01); G06T 5/00 (2006.01); G06T 5/10 (2006.01); G06T 5/50 (2006.01); H04N 5/217 (2011.01); H04N 5/32 (2006.01); H04N 5/365 (2011.01); H04N 17/00 (2006.01);
U.S. Cl.
CPC ...
A61B 6/4291 (2013.01); A61B 6/4441 (2013.01); A61B 6/488 (2013.01); A61B 6/5252 (2013.01); A61B 6/5258 (2013.01); A61B 6/5282 (2013.01); A61B 6/54 (2013.01); A61B 6/585 (2013.01); G06T 5/002 (2013.01); G06T 5/10 (2013.01); G06T 5/50 (2013.01); H04N 5/217 (2013.01); H04N 5/32 (2013.01); G06T 2207/10116 (2013.01); G06T 2207/20048 (2013.01); G06T 2207/20056 (2013.01); G06T 2207/20064 (2013.01); G06T 2207/20212 (2013.01); G06T 2207/20224 (2013.01); G06T 2207/30004 (2013.01); H04N 5/365 (2013.01); H04N 17/002 (2013.01);
Abstract

A method for correction of an x-ray image recorded with an x-ray device with an anti-scatter grid for effects of the anti-scatter grid is provided. The anti-scatter grid has a spatially periodically repeating geometrical embodiment, and a calibration image recorded without an imaging object is used. The calibration image and the x-ray image are transformed by a transformation into the position frequency space. In the position frequency space, adaptation parameters describing changes of the calibration image optimizing a measure of matching between the x-ray image and the calibration image are established. For correction, the adapted calibration image is subtracted from the x-ray image, and the x-ray image is transformed back into the position space again using an inverse of the transformation.


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