The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 18, 2018

Filed:

Oct. 08, 2015
Applicant:

Fuji Electric Co., Ltd., Kawasaki-shi, Kanagawa, JP;

Inventors:

Kazumasa Kido, Kawasaki, JP;

Takashi Saitou, Kawasaki, JP;

Kyouhei Fukuda, Kawasaki, JP;

Shinji Tada, Kawasaki, JP;

Fumihiko Momose, Kawasaki, JP;

Yoshitaka Nishimura, Kawasaki, JP;

Assignee:

FUJI ELECTRIC CO., LTD., Kanagawa, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 23/00 (2006.01); B23K 1/00 (2006.01); B23K 35/26 (2006.01); C22C 13/02 (2006.01); H01L 21/52 (2006.01); B23K 1/008 (2006.01); B23K 1/012 (2006.01); B23K 1/20 (2006.01); B23K 35/02 (2006.01); B23K 1/19 (2006.01); B23K 103/00 (2006.01); B23K 101/42 (2006.01); H01L 23/051 (2006.01);
U.S. Cl.
CPC ...
H01L 24/29 (2013.01); B23K 1/00 (2013.01); B23K 1/0008 (2013.01); B23K 1/008 (2013.01); B23K 1/0016 (2013.01); B23K 1/012 (2013.01); B23K 1/19 (2013.01); B23K 1/203 (2013.01); B23K 35/025 (2013.01); B23K 35/0244 (2013.01); B23K 35/26 (2013.01); B23K 35/262 (2013.01); C22C 13/02 (2013.01); H01L 21/52 (2013.01); H01L 24/32 (2013.01); H01L 24/83 (2013.01); B23K 2103/56 (2018.08); B23K 2201/42 (2013.01); B23K 2203/56 (2015.10); H01L 23/051 (2013.01); H01L 24/45 (2013.01); H01L 24/73 (2013.01); H01L 2224/2932 (2013.01); H01L 2224/29111 (2013.01); H01L 2224/32225 (2013.01); H01L 2224/32501 (2013.01); H01L 2224/45124 (2013.01); H01L 2224/73265 (2013.01); H01L 2224/83447 (2013.01); H01L 2224/83815 (2013.01); H01L 2924/351 (2013.01);
Abstract

A solder joint layer has a structure in which plural fine-grained second crystal sections () precipitate at crystal grain boundaries between first crystal sections () dispersed in a matrix. The first crystal sections () are Sn crystal grains containing tin and antimony in a predetermined proportion. The second crystal sections () are made up of a first portion containing a predetermined proportion of Ag atoms with respect to Sn atoms, or a second portion containing a predetermined proportion of Cu atoms with respect to Sn atoms, or both. The solder joint layer may have third crystal sections () which are crystal grains that contain a predetermined proportion of Sb atoms with respect to Sn atoms. As a result, solder joining is enabled at a low melting point, and a highly reliable solder joint layer having a substantially uniform metal structure can be formed.


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