The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 18, 2018

Filed:

Aug. 17, 2016
Applicant:

Kelk Ltd., Hiratsuka-shi, Kanagawa, JP;

Inventor:

Kazuhiro Mimura, Hiratsuka, JP;

Assignee:

KELK Ltd., Hiratsuka-shi, Kanagawa, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 19/00 (2018.01); H01L 21/67 (2006.01); G05D 23/19 (2006.01);
U.S. Cl.
CPC ...
H01L 21/67248 (2013.01); G05D 23/1917 (2013.01); H01L 21/67109 (2013.01);
Abstract

A temperature controller for a semiconductor wafer is configured to perform a temperature control on a plurality of temperature adjusters including a reference temperature adjuster to perform a temperature adjustment of the semiconductor wafer, in which a manipulated variable calculator to give a manipulated variable to a master loop and a slave loop includes a master-slave switching unit configured to switch between the master loop and the slave loop and a master-slave cancellation unit configured to cancel a setting of the master loop and the slave loop when a temperature setpoint of the slave loop is set to have a temperature gradient against a temperature setpoint of the master loop.


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