The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 18, 2018
Filed:
Mar. 08, 2016
Canon Kabushiki Kaisha, Tokyo, JP;
Tomoaki Higo, Tokyo, JP;
Canon Kabushiki Kaisha, Tokyo, JP;
Abstract
An information processing apparatus for, to classify and detect a plurality of types of defects, detecting a defect in a target object without using data obtained by prior learning includes an acquisition unit configured to acquire an image group obtained by capturing a target object irradiated with light from a plurality of illumination units placed at a plurality of different positions, a generation unit configured to, based on luminance information of images included in the image group, generate a first luminance profile indicating a change in a luminance value of a first region, which is a region corresponding between the images, and a second luminance profile indicating a change in a luminance value of a second region, which is a region corresponding between the images, and a detection unit configured to detect a defect in the target object based on the first luminance profile and the second luminance profile.