The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 18, 2018
Filed:
Feb. 12, 2018
Sas Institute Inc., Cary, NC (US);
Wei Xiao, Seattle, WA (US);
Jorge Manuel Gomes da Silva, Durham, NC (US);
Saba Emrani, Santa Clara, CA (US);
Arin Chaudhuri, Raleigh, NC (US);
SAS Institute Inc., Cary, NC (US);
Abstract
A computing device detects an abnormal observation vector using a principal components decomposition. The principal components decomposition includes a sparse noise vector scomputed for the observation vector that includes a plurality of values, wherein each value is associated with a variable to define a plurality of variables. The sparse noise vector shas a dimension equal to m a number of the plurality of variables. A zero counter time series value ĉis computed using ĉ=Σs[i]. A probability value for ĉis computed using p=ΣH[i]/ΣH[i], where H[i] includes a count of a number of times each value of ĉoccurred for previous observation vectors. The probability value is compared with a predefined abnormal observation probability value. An abnormal observation indicator is set when the probability value indicates the observation vector is abnormal. The observation vector is output when the probability value indicates the observation vector is abnormal.