The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 18, 2018
Filed:
Oct. 14, 2016
Bank of America Corporation, Charlotte, NC (US);
Richard Scot, Huntersville, NC (US);
Kesha Hamilton, Cedar Hill, TX (US);
Jason Greeter, Charlotte, NC (US);
Terry G. McConnell, Oak Park, CA (US);
Bank of America Corporation, Charlotte, NC (US);
Abstract
Systems and arrangements for integrating two or more overlapping requirements from different assessments are presented. In some examples, determining whether requirements are considered overlapping may include identifying a plurality of aspects of each requirement and comparing the aspects to aspects of other requirements to determine whether at least a threshold number of aspects are the same. Upon identifying two or more overlapping requirements, the system may integrate the two or more overlapping requirements into an integrated requirement. A unique identifier may be generated for the integrated requirement and associated with the integrated requirement. Data may be received responsive to a request for data for an integrated requirement and the system may associate the received data with the integrated requirement and may map the received data to the two or more requirements integrated into the integrated requirement.