The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 18, 2018
Filed:
May. 11, 2015
Nec Corporation, Minato-ku, Tokyo, JP;
Naoki Yoshinaga, Tokyo, JP;
NEC CORPORATION, Tokyo, JP;
Abstract
In an invariant relation analysis, a capability to detect abnormalities is improved and erroneous abnormality reports are reduced. A system analysis device () includes a correlation model generation unit () and a learning reliability calculation unit (). The correlation model generation unit () generates, based on time series of a plurality of metrics in a system in a learning period, a correlation model that includes a correlation between metrics. The learning reliability calculation unit () calculates learning reliability of the correlation, based on a behavior of a time series of each of metrics relevant to the correlation included in the correlation model, in the learning period.