The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 18, 2018
Filed:
Oct. 28, 2014
University of Hyogo, Kobe-shi, Hyogo, JP;
Kunihiro Sato, Himeji, JP;
University of Hyogo, Kobe-shi, JP;
Abstract
The present invention can realize both a transmission type and a reflection type, and provides a holographic microscope which can exceed the resolution of the conventional optical microscope, a hologram data acquisition method for a high-resolution image, and a high-resolution hologram image reconstruction method. In-line spherical wave reference light (L) is recorded in a hologram (I) using spherical wave reference light (R), and an object light (O) and an illumination light (Q) are recorded in a hologram (I) using a spherical wave reference light (R) by illuminating the object with an illumination light (Q, j=1, . . . , N) which is changed its incident direction. From those holograms, a hologram (J), from which the component of the reference light (R) is removed, is generated, and from the hologram, a light wave (h) is generated. A light wave (c) of the illumination light (Q) is separated from the light wave (h), and using its phase component (ξ=c/|c|), a phase adjustment reconstruction light wave is derived and added up as (H=Σh/ξ), and an object image (S=|H|) is reconstructed.