The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 18, 2018
Filed:
Mar. 10, 2016
Hoya Lens Thailand Ltd., Patumthani, TH;
HOYA LENS THAILAND LTD., Patumthani, TH;
Abstract
A spectacle wearing parameter measurement device used in measurement of a spectacle wearing parameter of a subject who is to wear a spectacle frame, the spectacle wearing parameter measurement device includes: an information processing unit that acquires each of a first image as a face image of the subject in a spectacle-frame wearing state and a second image as a face image in a spectacle-frame non-wearing state and prepares a third image obtained by associating the first image and the second image; a display screen unit that displays the third image prepared by the information processing unit; an operation unit that specifies a measurement reference point of the spectacle wearing parameter on the third image displayed on the display screen unit; and a measurement computation section that calculates the spectacle wearing parameter by using data of the specified measurement reference point.