The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 18, 2018

Filed:

Oct. 05, 2016
Applicant:

Seiko Epson Corporation, Tokyo, JP;

Inventor:

Tomonori Matsushita, Chino, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B 26/00 (2006.01); G02B 27/00 (2006.01); G01J 3/26 (2006.01); G02B 5/28 (2006.01);
U.S. Cl.
CPC ...
G02B 26/001 (2013.01); G02B 27/0012 (2013.01); G01J 3/26 (2013.01); G02B 5/285 (2013.01);
Abstract

A wavelength variable interference filter includes a fixed reflection film, a movable reflection film, and an actuator that changes a gap between the films. A wavelength of output light is first wavelength λα. A center wavelength in a target wavelength region is measurement center wavelength λ. A peak center wavelength in reflection characteristics of the movable reflection film is first center wavelength λ. A peak center wavelength in reflection characteristics of the fixed reflection film is second center wavelength λ. The gap between the films when light of the first wavelength λα is transmitted is dα(λ). When a pair of optical films face each other, a center wavelength in reflection characteristics of the pair is the measurement center wavelength λ, and the light of the first wavelength λα is outputted, the gap between the pair of optical films is dα(λ). Further, dα(λ)<dα(λλ).


Find Patent Forward Citations

Loading…