The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 18, 2018

Filed:

Jun. 23, 2015
Applicant:

Hitachi, Ltd., Tokyo, JP;

Inventors:

Hideta Habara, Tokyo, JP;

Yoshihisa Soutome, Tokyo, JP;

Masahiro Takizawa, Tokyo, JP;

Yoshiaki Sato, Tokyo, JP;

Assignee:

HITACHI, LTD., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 33/28 (2006.01); A61B 5/055 (2006.01); G01R 33/36 (2006.01);
U.S. Cl.
CPC ...
G01R 33/288 (2013.01); A61B 5/055 (2013.01); G01R 33/3607 (2013.01);
Abstract

Provided is a technique that enables accurate SAR management using power consumption by an object (P) that was calculated based on accurately acquired Q-factors. For this purpose, the present invention calculates Q-factors of each channel of a high-frequency antenna using measurement results of amplitudes of forward waves and reflected waves of each high-frequency signal between three or more different frequencies. An existing SAR monitor in an MRI apparatus is used for the amplitude measurement. Also, the Q-factors are calculated based on a circuit coefficient to be acquired by fitting the measurement results to a predetermined circuit model. Then, the power consumption by an object (P) is calculated using the calculated Q-factors in order to manage the SAR.


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