The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 18, 2018
Filed:
Aug. 31, 2017
Nuctech Company Limited, Beijing, CN;
Zhiqiang Chen, Beijing, CN;
Yuanjing Li, Beijing, CN;
Shangmin Sun, Beijing, CN;
Yu Hu, Beijing, CN;
Yuan Ma, Beijing, CN;
Qiangqiang Wang, Beijing, CN;
Long Du, Beijing, CN;
Wei Li, Beijing, CN;
NUCTECH COMPANY LIMITED, Beijing, CN;
Abstract
This invention relates to a movable divided inspection system and method, wherein the scanning inspection system comprises a first radiation source, a first detection means, a first automated guided vehicle and a second automated guided vehicle. The first radiation source is mounted on the first automated guided vehicle. The first detection means is mounted on the second automated guided vehicle. The first automated guided vehicle and the second automated guided vehicle are able to drive the first radiation source and the first detection means to a preset scan inspection position, so as to form a scanning passage for passage of an article to be scanned between the first and second automated guided vehicle, such that scanning inspection of said article to be scanned is realized by relative movement of said article to be scanned with reference to said first automated guided vehicle and said second automated guided vehicle.