The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 18, 2018
Filed:
Jul. 06, 2016
Applicant:
Totalfoersvarets Forskningsinstitut, Stockholm, SE;
Inventors:
Markus Nordberg, Umea, SE;
Henric Oestmark, Hoeloe, SE;
Assignee:
TOTALFOERSVARETS FORSKNINGSINSTITUT, Stockholm, SE;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J 3/44 (2006.01); G01N 21/65 (2006.01); G01N 33/22 (2006.01); G01J 3/02 (2006.01);
U.S. Cl.
CPC ...
G01N 21/65 (2013.01); G01J 3/0208 (2013.01); G01J 3/0229 (2013.01); G01J 3/44 (2013.01); G01N 33/227 (2013.01); G01N 2201/06113 (2013.01);
Abstract
A stand-off optical measuring system based on Raman scattering for detecting and identifying chemical threat substances includes a spectrometer having a dispersive device in front of a 2-dimensional detector, with the entrance of the spectrometer being a coded aperture. The measuring system is configured to be able to quickly adapt to different measuring conditions by the coded aperture being a programmable coded aperture.