The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 18, 2018
Filed:
Apr. 14, 2015
Applicant:
The Regents of the University of California, Oakland, CA (US);
Inventors:
James W. Chan, Elk Grove, CA (US);
Lingbo Kong, Davis, CA (US);
Assignee:
The Regents of the University of California, Oakland, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/65 (2006.01); G01J 3/06 (2006.01); G01J 3/44 (2006.01);
U.S. Cl.
CPC ...
G01N 21/65 (2013.01); G01J 3/06 (2013.01); G01J 3/44 (2013.01); G01N 2201/068 (2013.01); G01N 2201/06113 (2013.01);
Abstract
Methods and systems for reconstructing individual spectra acquired from laser interrogation spots in a 2D array illuminating a particle are described. A particle is positioned in a 2D array that includes multiple laser interrogation spots. The laser interrogation spots of the particle are detected in the 2D array using a spectrometer. Multifocal spectral patterns are generated based on the laser interrogation spots, and an individual spectrum for each laser interrogation spot is reconstructed based on the plurality of multifocal spectral patterns.