The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 18, 2018
Filed:
Jun. 06, 2014
Malvern Instruments Limited, Worcestershire, GB;
E. Neil Lewis, Columbia, MD (US);
MALVERN PANALYTICAL LIMITED, Malvern, Worcestershire, GB;
Abstract
An optical sample characterization method is disclosed comprising: holding a sample in a sample container proximate at least one two-dimensional detector array assembly, wherein the sample container has a first end and a second end; setting up a gradient between the first end of the sample container and the second end of the sample container; illuminating the sample between the first end of the sample container and the second end of the sample container; and detecting light received from the illuminated sample from the first end of the sample container to the second end of the sample container by the two-dimensional array assembly.