The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 18, 2018

Filed:

Feb. 27, 2017
Applicant:

Sysmex Corporation, Kobe-shi, Hyogo, JP;

Inventors:

Seiichiro Tabata, Kobe, JP;

Masaki Ishisaka, Kobe, JP;

Kenji Akama, Kobe, JP;

Yoshinobu Miura, Kobe, JP;

Masatoshi Yanagida, Kobe, JP;

Assignee:

SYSMEX CORPORATION, Kobe, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 15/14 (2006.01); G01N 21/05 (2006.01); G01N 15/10 (2006.01);
U.S. Cl.
CPC ...
G01N 15/1434 (2013.01); G01N 21/05 (2013.01); G01N 2015/1006 (2013.01);
Abstract

A particle imaging apparatus comprises a flow path comprising a first flow path section, a second flow path section connected downstream of the first flow path section, and a third flow path section that is branched from the first flow path section, a particle detection unit comprising a light source and a light detector, a particle sorting unit configured to adjust a flow direction of the particle, and a particle imaging unit configured to take an image of a particle that flows in the second flow path section. The flow path is structured such that a cross-sectional area of the second flow path section is greater than a cross-sectional area of the first flow path section. The first flow path section and the second flow path section are disposed so as to be linearly aligned.


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