The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 18, 2018

Filed:

Aug. 13, 2015
Applicant:

Bae Systems Information & Electronic Systems Integration Inc., Nashua, NH (US);

Inventors:

Paul R Moffitt, Hollis, NH (US);

Peter A Ketteridge, Amherst, NH (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J 3/02 (2006.01); G01J 3/453 (2006.01); G01J 3/10 (2006.01); G01N 21/3504 (2014.01); G01B 9/02 (2006.01); G01N 21/35 (2014.01);
U.S. Cl.
CPC ...
G01J 3/453 (2013.01); G01B 9/02015 (2013.01); G01J 3/0205 (2013.01); G01J 3/108 (2013.01); G01N 21/3504 (2013.01); G01N 2021/3595 (2013.01);
Abstract

A compact, low cost FTIR spectrometer with no moving parts includes an interferometer having optical paths through silicon waveguides. The optical path lengths are varied by changing the temperature and/or carrier density of at least one of the waveguides. In embodiments, the interferometer is a Mach-Zehnder interferometer. Embodiments vary both optical path lengths in opposite directions. In embodiments, a germanium or InGaAs IR detector is grown on the same wafer as the waveguides. Embodiments include a laser pump, such as a COT CW diode laser, and wavelength mixer, such as an OPGaAs or OPGaP converter, for up and/or down converting measured IR wavelengths into a range compatible with the waveguide and detector materials. The wavelength mixer can be a waveguide. Embodiments include a sample compartment and an IR source such as a glowbar. In embodiments, the sample compartment can be exposed to ambient atmosphere for analysis of gases contained therein.


Find Patent Forward Citations

Loading…