The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 18, 2018
Filed:
Jun. 21, 2016
The United States of America As Represented BY the Secretary of the Navy, Washington, DC (US);
Mark Halter, Washington, IN (US);
The United States of America, as represented by the Secretary of the Navy, Washington, DC (US);
Abstract
Test systems coupled to a device under test (DUT) with different segments or stages and related methods are provided. Exemplary test systems include logic that executes concurrent determinations or tests for multiple DUT segments or stages. Exemplary test systems can include logic that concurrently executes various tests associated with different DUT segments including determinations or testing for a specified DUT test environment, determinations or tests of when data will be made available to various DUT segments, and various determinations or tests that may be completed before data is made available to specified DUT segments. At least one embodiment of a first stage concurrent determination test system determines first stage tests do not require a specified target and high pressure gas conditions for DUT testing and at least one embodiment of a second stage concurrent test system does require a specified target and high pressure gas conditions for DUT testing.