The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 18, 2018

Filed:

Aug. 01, 2017
Applicant:

Epistar Corporation, Hsinchu, TW;

Inventors:

Jun-Yi Li, Hsinchu, TW;

Chun-Yu Lin, Hsinchu, TW;

Shih-Chang Lee, Hsinchu, TW;

Yi-Ming Chen, Hsinchu, TW;

Assignee:

EPISTAR CORPORATION, Hsinchu, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 33/60 (2010.01); F21S 43/14 (2018.01); H01L 33/00 (2010.01); G08G 1/095 (2006.01); H01L 33/42 (2010.01);
U.S. Cl.
CPC ...
F21S 43/14 (2018.01); H01L 33/0062 (2013.01); H01L 33/60 (2013.01); G08G 1/095 (2013.01); H01L 33/42 (2013.01);
Abstract

A light-emitting device comprises a semiconductor structure comprising a first conductivity-type semiconductor layer, a second conductivity-type semiconductor layer, a first intermediate layer, a second intermediate layer, and an active region capable of emitting radiation, wherein the active region is between the first intermediate layer and the second intermediate layer, the first intermediate layer is in direct contact with the first conductivity-type semiconductor layer, the second intermediate layer is in direct contact with the second conductivity-type semiconductor layer, and the active region comprises alternated well layers and barrier layers, wherein each barrier layer has a thickness; wherein a first difference between a refractive index of the first intermediate layer and a refractive index of the first conductivity-type semiconductor layer is less than a second difference between a refractive index of the second intermediate layer and a refractive index of the second conductivity-type semiconductor layer.


Find Patent Forward Citations

Loading…