The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 11, 2018
Filed:
Mar. 09, 2017
Applicants:
Xin Yuan, New Providence, NJ (US);
Paul A. Wilford, Bernardville, NJ (US);
Inventors:
Xin Yuan, New Providence, NJ (US);
Paul A. Wilford, Bernardville, NJ (US);
Assignee:
Nokia of America Corporation, Murray Hill, NJ (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 5/247 (2006.01); H04N 5/232 (2006.01); H04N 5/353 (2011.01); H04N 5/225 (2006.01);
U.S. Cl.
CPC ...
H04N 5/247 (2013.01); H04N 5/2254 (2013.01); H04N 5/2256 (2013.01); H04N 5/23232 (2013.01); H04N 5/23293 (2013.01); H04N 5/353 (2013.01);
Abstract
A time-dependent aperture is configured to modulate light during an integration time interval. A first detector is configured to capture a first image of a scene during the integration time interval using light received from the time-dependent aperture. A second detector is configured to capture a second image of the scene concurrently with the first detector capturing the first image. A processor is configured to reconstruct a plurality of images of the scene based on the first image and the second image.