The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 11, 2018

Filed:

May. 24, 2016
Applicant:

Psemi Corporation, San Diego, CA (US);

Inventors:

Ethan Prevost, Poway, CA (US);

Rahul Dubal, San Diego, CA (US);

Assignee:

pSemi Corporation, San Diego, CA (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H03K 17/00 (2006.01); H03K 19/21 (2006.01);
U.S. Cl.
CPC ...
H03K 17/002 (2013.01); H03K 19/21 (2013.01);
Abstract

A circuit architecture and process that provides for a dual-mode methodology for an RF integrated circuit (IC) switch circuit that allows switching between a direct mapping configuration and a fully decoded mapping configuration, and further provides for changing either mapping configuration after fabrication. A control word is selectively compared to a programmed map register value so that, in a first mode, only one bit position of a control word matches a decoded programmed map bit pattern, and in a second mode, all bits of a control word match a corresponding programmed map bit pattern. Because the map registers can be programmed at least once after IC fabrication, the exact mapping required for a particular application can be determined post fabrication. Further, the first mode of operation is often beneficial during testing because multiple RF signal paths can be turned on at the same time and thus tested in parallel.


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