The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 11, 2018

Filed:

Apr. 26, 2018
Applicant:

Alentic Microscience Inc., Halifax, CA;

Inventors:

Alan Marc Fine, Prospect, CA;

Madhuranga Srinath Rankaduwa, Halifax, CA;

Assignee:

Alentic Microscience Inc., Halifax, Nova Scotia, CA;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 27/146 (2006.01); G01N 21/27 (2006.01); G01N 33/49 (2006.01);
U.S. Cl.
CPC ...
H01L 27/14632 (2013.01); G01N 21/27 (2013.01); G01N 33/49 (2013.01); H01L 27/14636 (2013.01); H01L 27/14687 (2013.01);
Abstract

Among other things, an integral image sensor includes a sensor surface having a surface area at which light-sensitive pixels are arranged in rows and columns. The surface area includes two or more light-sensitive subareas each of the subareas having been configured to have been diced from a wafer along two orthogonal dimensions to form a discrete image sensor. The two or more light-sensitive subareas are arranged along one of the two orthogonal dimensions. The sensor surface of the integral image sensor is flat and continuous across the two or more subareas.


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