The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 11, 2018

Filed:

Mar. 27, 2015
Applicant:

Wisconsin Alumni Research Foundation, Madison, WI (US);

Inventors:

Nicholas W. Kwiecien, Madison, WI (US);

Derek J. Bailey, Madison, WI (US);

Michael S. Westphall, Fitchburg, WI (US);

Joshua J. Coon, Middleton, WI (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 49/00 (2006.01); G06K 9/00 (2006.01); G01N 30/72 (2006.01);
U.S. Cl.
CPC ...
H01J 49/0036 (2013.01); G06K 9/00543 (2013.01); G01N 30/72 (2013.01);
Abstract

The invention provides methods, systems and algorithms for identifying high-resolution mass spectra. In some embodiments, an analyte is ionized and analyzed using high-resolution mass spectrometry (MS) at high mass accuracy (such as ≤75 ppm or ≤30 ppm) and the obtained mass spectra are matched with one or more prospective candidate molecules or chemical formulas. The invention provide, for example, methods and systems wherein the possible fragments that can be generated from the candidate molecules or chemical formulas are determined as well as the masses of each of these fragments. The invention provide, for example, methods and systems wherein the high-resolution mass spectra are then compared with the calculated fragment masses for each of the candidate molecules or chemical formula, and the portion of the high-resolution mass spectra that corresponds or can be explained by the calculated fragment masses is determined.


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