The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 11, 2018

Filed:

Apr. 03, 2017
Applicant:

Micromass Uk Limited, Wilmslow, GB;

Inventors:

Emmanuelle Claude, Cheshire, FR;

Mark Williams Towers, Cheshire, GB;

Kieran Neeson, Manchester, GB;

Richard Denny, Staffordshire, GB;

Jeffrey M. Brown, Cheshire, GB;

Paul R. Murray, Manchester, GB;

Mark McDowall, Manchester, GB;

Assignee:

MICROMASS UK LIMITED, Wilmslow, GB;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 49/00 (2006.01); H01J 49/26 (2006.01); G01N 27/62 (2006.01); H01J 49/40 (2006.01); H01J 49/44 (2006.01);
U.S. Cl.
CPC ...
H01J 49/0031 (2013.01); G01N 27/622 (2013.01); H01J 49/004 (2013.01); H01J 49/005 (2013.01); H01J 49/0027 (2013.01); H01J 49/0036 (2013.01); H01J 49/26 (2013.01); H01J 49/40 (2013.01); H01J 49/446 (2013.01); H01J 2237/05 (2013.01);
Abstract

The present invention relates to a method of mass spectrometry, an apparatus adapted to perform the method and a mass spectrometer. More particularly, but not exclusively, the present invention relates to a method of mass spectrometry comprising the step of associating parent and fragmentation ions from a sample by measuring the parent and fragmentation ions from two or more different areas of the sample and identifying changes in the number of parent ions between the areas in the sample, and corresponding changes in the number of fragmentation ions between the two areas.


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