The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 11, 2018

Filed:

Jun. 23, 2016
Applicant:

Spts Technologies Limited, Newport, GB;

Inventors:

Anthony Paul Wilby, Bristol, GB;

Stephen R Burgess, Gwent, GB;

Ian Moncrieff, Wotton-Under-Edge, GB;

Paul Densley, Newport, GB;

Clive L Widdicks, Bristol, GB;

Paul Rich, Bristol, GB;

Adrian Thomas, Newport, GB;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 37/32 (2006.01); H01L 21/67 (2006.01); C23C 14/34 (2006.01);
U.S. Cl.
CPC ...
H01J 37/32495 (2013.01); C23C 14/34 (2013.01); H01J 37/321 (2013.01); H01J 37/32642 (2013.01); H01J 37/32715 (2013.01); H01L 21/67069 (2013.01); H01J 2237/334 (2013.01);
Abstract

An ICP plasma etching apparatus for etching a substrate includes at least one chamber, a substrate support positioned within the chamber, a plasma production device for producing a plasma for use in etching the substrate, and a protective structure which surrounds the substrate support so that, in use, a peripheral portion of the substrate is protected from unwanted deposition of material. The protective structure is arranged to be electrically biased and is formed from a metallic material so that metallic material can be sputtered from the protective structure onto an interior surface of the chamber to adhere particulate material to the interior surface.


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