The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 11, 2018
Filed:
Nov. 25, 2015
Zhuhai Ritech Technology Co. Ltd., Zhuhai, Guangdong, CN;
Fugen Zhang, Guangdong, CN;
Yunpeng Li, Guangdong, CN;
ZHUHAI RITECH TECHNOLOGY CO. LTD., Zhuhai, CN;
Abstract
The disclosure provides a stereoscopic vision three dimensional measurement method and system calculating a laser speckle as a texture. The measurement method includes that: a forming process of a laser speckle is simulated first, and calculation is performed to obtain a digitized laser speckle diagram, then the laser speckle diagram is outputted onto a film or a photographic dry plate, the laser speckle diagram on the film or the photographic dry plate is projected onto a surface of a measured object subsequently; a left view and a right view of the measured object are acquired finally, and all matching points corresponding to each other are found in the left view and the right view, and then a three dimensional point cloud of the surface of the measured object is reconstructed.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile