The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 11, 2018
Filed:
Jul. 22, 2016
Tsinghua University, Beijing, CN;
Nuctech Company Limited, Haidian, CN;
Kejun Kang, Beijing, CN;
Zhiqiang Chen, Beijing, CN;
Yuanjing Li, Beijing, CN;
Li Zhang, Beijing, CN;
Ziran Zhao, Beijing, CN;
Yaohong Liu, Beijing, CN;
Jianping Gu, Beijing, CN;
Zhiming Wang, Beijing, CN;
Tsinghua University, Beijing, CN;
Nuctech Company Limited, Haidian, CN;
Abstract
The present disclosure relates to a method and device for estimating a point spread function. In one implementation, a method includes capturing, by a scanning device, an image by scanning a plurality of rectangle blocks which are same sized and closely arranged, wherein the plurality of rectangle blocks are made of different materials and/or have different mass thicknesses, and an incident direction of rays is perpendicular to a scanning direction and a surface of the plurality of rectangle blocks arranged closely during scanning; obtaining line spread functions for two directions along a length side and a width side of each of the rectangle blocks based on the scanned image, and obtaining standard deviation parameters of the line spread functions; and combining the standard deviation parameters for the two directions to obtain a two dimensional Point Spread Function (PSF) parameter so as to estimate the point spread function.