The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 11, 2018

Filed:

Jan. 17, 2017
Applicant:

Advanced Micro Devices, Inc., Sunnyvale, CA (US);

Inventor:

Evgene Fainstain, San Jose, CA (US);

Assignee:

Advanced Micro Devices, Inc., Santa Clara, CA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06T 5/00 (2006.01); G06T 15/00 (2011.01); G06T 19/20 (2011.01); G06T 1/20 (2006.01); G06T 1/60 (2006.01); G06T 15/50 (2011.01);
U.S. Cl.
CPC ...
G06T 5/002 (2013.01); G06T 1/20 (2013.01); G06T 1/60 (2013.01); G06T 15/005 (2013.01); G06T 15/503 (2013.01); G06T 19/20 (2013.01); G06T 2219/2004 (2013.01); G06T 2219/2016 (2013.01);
Abstract

Systems, apparatuses, and methods for generating and utilizing sub-pixel sampling patterns on a processor are disclosed. In one embodiment, a processor includes at least multiple execution units and a memory. The processor generates sub-pixel sampling coordinates within each pixel of an image being rendered based on a rotated grid superimposed on the image. The processor also specifies an amount of rotation for the rotated grid. The processor utilizes the sub-pixel sampling coordinates for determining which locations to sample within the image being rendered. The sampling patterns generated based on these techniques enable using more complex and computationally efficient anti-aliasing resolve filters, resulting in higher quality images.


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