The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 11, 2018

Filed:

Sep. 30, 2015
Applicant:

Emc Corporation, Hopkinton, MA (US);

Inventors:

Jeroen Mattijs van Rotterdam, Berkeley, CA (US);

David Humby, Ontario, CA;

Una T. Kearns, Dublin, IE;

Raman Meenakshisundaram, Bangalore, IN;

Assignee:

EMC IP Holding Company LLC, Hopkinton, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04L 29/06 (2006.01); G06F 17/30 (2006.01); H04L 29/08 (2006.01);
U.S. Cl.
CPC ...
G06F 17/30554 (2013.01); H04L 63/102 (2013.01); H04L 67/18 (2013.01);
Abstract

A method and system for requesting a first data, including receiving from a first requestor a first query request to read the first data located in a first geographic location, where the first requestor is located in a second geographic location. The method further includes executing the first query request by a query engine in the first geographic location to obtain a first query result, obtaining a first compliance rule based on at least one of the first geographic location, the second geographic location, generating an exportable result by applying the first compliance rule to the first query result, and transmitting the first exportable result to the first requestor.


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