The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 11, 2018

Filed:

Jan. 12, 2017
Applicant:

Hewlett Packard Enterprise Development Lp, Houston, TX (US);

Inventors:

Gabriel Dayan, Yehud, IL;

Eli Revach, Yehud, IL;

Pavel Danichev, Yehud, IL;

Avihay Mor, Yehud, IL;

Assignee:

ENTIT SOFTWARE LLC, Sunnyvale, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/18 (2006.01); G06F 5/01 (2006.01); G06F 7/544 (2006.01);
U.S. Cl.
CPC ...
G06F 5/01 (2013.01); G06F 7/544 (2013.01); G06F 17/18 (2013.01);
Abstract

Examples relate to calculating normalize metrics. The examples disclosed herein calculate respective normalized first metric values for each of a plurality of first metric values that are on a time scale and respective normalized second metric values for each of the plurality of raw second metric values that are on the time scale, where the plurality of first metric values are associated with a first metric, and the plurality of second metric values are associated with a second metric. An extremum of the normalized first metric value and the normalized second metric value at each time of the time scale is averaged to calculate a plurality of extremum baseline values. Examples herein calculate a plurality of sleeve values of the plurality of extremum baseline values based on a standard deviation of the plurality of extremum baseline values.


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