The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 11, 2018

Filed:

Apr. 28, 2017
Applicant:

Emc Ip Holding Company Llc, Hopkinton, MA (US);

Inventors:

Jamin Kang, Beijing, CN;

Lili Chen, Hopkinton, MA (US);

Jian Gao, Beijing, CN;

Hongpo Gao, Beijing, CN;

Geng Han, Beijing, CN;

Jibing Dong, Beijing, CN;

Assignee:

EMC IP Holding Company LLC, Hopkinton, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 3/06 (2006.01);
U.S. Cl.
CPC ...
G06F 3/0619 (2013.01); G06F 3/065 (2013.01); G06F 3/0683 (2013.01);
Abstract

A method performed in a Mapped RAID system includes: (a) in response to a source disk (SD) reaching EOL status: (1) copying a first source disk extent (DE) (belonging to a first RAID extent) from the SD to a first spare DE on a first destination disk and (2) copying a second source DE from the SD to a second spare DE (belonging to a second RAID extent) on a second destination disk, (b) in response to completely copying the first source DE from the SD to the first spare DE, mapping the first spare DE to belong to the first RAID extent in place of the first source DE, and (c) in response to completely copying the second source DE from the SD to the second spare DE, mapping the second spare DE to belong to the second RAID extent in place of the second source DE.


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