The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 11, 2018
Filed:
Jan. 21, 2013
Applicant:
Sony Corporation, Tokyo, JP;
Inventors:
Suguru Dowaki, Kanagawa, JP;
Eriko Matsui, Tokyo, JP;
Hirokazu Tatsuta, Tokyo, JP;
Masanobu Tamai, Chiba, JP;
Kazuhiro Nakagawa, Saitama, JP;
Assignee:
SONY CORPORATION, Tokyo, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B 21/36 (2006.01); G01J 3/44 (2006.01); G01N 21/65 (2006.01); G01N 21/31 (2006.01); G02B 21/16 (2006.01); G01N 21/64 (2006.01); G02B 21/00 (2006.01);
U.S. Cl.
CPC ...
G02B 21/365 (2013.01); G01J 3/44 (2013.01); G01N 21/31 (2013.01); G01N 21/65 (2013.01); G02B 21/0096 (2013.01); G02B 21/16 (2013.01); G01N 21/6458 (2013.01); G02B 21/0092 (2013.01);
Abstract
An observation apparatus according to the present technology includes a microscope optical system, an imaging unit, a spectroscopic unit, and a detection unit. The imaging unit captures an image via the microscope optical system. The spectroscopic unit acquires an absorption spectrum or a Raman spectrum in an ultraviolet, visible, or infrared area via the microscope optical system. The detection unit detect an observation target object in an observed sample by using the absorption spectrum or the Raman spectrum.