The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 11, 2018
Filed:
Dec. 07, 2015
Masahiko Itoh, Osaka, JP;
Hiroyoshi Sekiguchi, Kanagawa, JP;
Masahiko Itoh, Osaka, JP;
Hiroyoshi Sekiguchi, Kanagawa, JP;
RICOH COMPANY, LTD., Tokyo, JP;
Abstract
A measuring system includes a first measuring unit which measures an object in front of a moving body in a first measuring area, a second measuring unit which measures the object in a second measuring area, the second measuring area being different from the first measuring area, a determining unit which determines whether a movement of the object satisfies a predetermined condition based on a measuring result of the first measuring unit, and a controller which causes the second measuring unit to start measuring the object in response to an event in which the determining unit determines that the object satisfies the predetermined condition and at least part of the object deviates from the first measuring area.