The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 11, 2018
Filed:
Sep. 29, 2017
Fraunhofer-gesellschaft Zur Foerderung Der Angewandten Forschung E.v., Munich, DE;
Technische Universitaet Berlin, Berlin, DE;
Ivan Ndip, Berlin, DE;
Volker Grosser, Rangsdorf, DE;
Christian Tschoban, Gross Kreutz, DE;
Brian Curran, Oranienburg, DE;
Max Huhn, Oranienburg, DE;
Klaus-Dieter Lang, Berlin, DE;
Fraunhofer-Gesellschaft zur Foerderung der angewandten Forschung e.V., Munich, DE;
Technische Universitaet Berlin, Berlin, DE;
Abstract
An apparatus and a method for determining an antenna characteristic of an antenna under test in free space is disclosed. Measurement results of a transmitted power of a measurement signal transmitted between the reference antenna and an antenna under test are detected, wherein detecting takes place in the frequency domain. The detected measurement results are transformed into the time domain and a time-domain filter is applied to the measurement results converted into the time domain. A filter width of the time-domain filter is determined in dependence on a spatial distance between the reference antenna and the antenna under test. Measurement result portions that result due to a multipath propagation of the measurement signal between the reference antenna and the antenna under test are reduced or removed.