The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 11, 2018

Filed:

Feb. 17, 2014
Applicant:

Isabellenhuette Heusler Gmbh & Co. KG, Dillenburg, DE;

Inventor:

Ullrich Hetzler, Dillenburg-Oberscheld, DE;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 19/00 (2006.01); G01R 1/20 (2006.01); G01R 35/00 (2006.01);
U.S. Cl.
CPC ...
G01R 19/0092 (2013.01); G01R 1/203 (2013.01); G01R 35/005 (2013.01);
Abstract

The invention relates to a measuring resistor (), in particular a low-resistance current-measuring resistor, comprising two terminal parts () that consist of a conductor material for introducing and discharging a current, and a resistor element () that consists of a resistor material, wherein the resistor element () is arranged between the two terminal parts () in the direction of the current and current flows through the resistor element (). According to one variant of the invention, the measuring resistor () has several pairs of voltage-measuring contacts () for measuring the voltage falling across the resistor element () in order to be able to compensate metrologically for inhomogeneities in the current density. In contrast, according to another variant of the invention, one pair of voltage-measuring contacts () is arranged at a location at which the measuring resistor () exhibits neither a capacitive behavior nor an inductive behavior, such that the current flowing through the measuring resistor () and the voltage across the voltage-measuring contacts () are substantially in phase.


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