The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 11, 2018
Filed:
Jul. 13, 2015
Applicant:
Sony Corporation, Tokyo, JP;
Inventors:
Assignee:
Sony Corporation, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 33/487 (2006.01); G01N 27/22 (2006.01); G01N 33/49 (2006.01); G01N 27/02 (2006.01);
U.S. Cl.
CPC ...
G01N 33/48707 (2013.01); G01N 27/221 (2013.01); G01N 27/226 (2013.01); G01N 33/49 (2013.01); G01N 33/4905 (2013.01); G01N 27/026 (2013.01);
Abstract
A contact structure body for use in a measuring device. The contact structure includes a separator that physically separates a sample holder from a measuring circuit, and a contact probe configured to electrically connect an electrode of the sample holder to the measuring circuit, the contact probe comprising. The contact structure body may be part of a system for determining a characteristic of a sample. The system includes a sample holder for holding sample. The sample holder includes an electrode. The system also includes a measuring circuit for measuring at least one property of the sample.